| 高分子 Vol.68 No.12 |
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特集 そうだ、“顕微鏡”で測ろう
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| 展望 COVER STORY: Highlight Reviews |
| 原子間力顕微鏡による高分子膜に埋もれたナノ構造の可視化 Visualization of Subsurface Nanostructures by Atomic Force Microscopy |
小林 圭 Kei KOBAYASHI |
| ＜要旨＞ 原子間力顕微鏡は試料表面の形状や物性分布を評価できるツールとしてさまざまな分野で広く用いられてきたが、最近高分子膜の表面から数百nmの深さに埋められたナノ粒子などのナノ構造を可視化できることがわかってきた。しかしながら、その可視化メカニズムは未解明である。本稿では筆者らの近年の研究を含め、本可視化技術の現状を紹介する。 Keywords: Atomic Force Microscopy / Subsurface Imaging / Contact Resonance / Scanning Thermal Noise Microscopy |
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| 高分子膜の高次構造・導電性分布と燃料電池の発電性能 Distributions of Three-Dimensional Structures and Properties in Polymer Membranes Affecting Performances of Fuel Cells |
犬飼 潤治 Junji INUKAI |
| ＜要旨＞ 高分子膜は膜内部と表面とで異なる高次構造をもち、一般的に異なる物理・化学的性質を示す。電流検出型原子間力顕微鏡によって画像化された高分子電解質膜表面の特性分布が燃料電池の発電性能に与える影響を一つの例として、高次構造を考慮に入れた高分子膜のパフォーマンス向上について述べる。 Keywords: Fuel Cell / Morphology / Ionic Conduction / Atomic Force Microscopy |
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| トピックス COVER STORY: Topics and Products |
| 原子間力顕微鏡を用いたグラフェンナノリボンの物性評価 Mechanical Properties of Graphene Nanoribbon Studied by Atomic Force Microscopy |
川井 茂樹 Shigeki KAWAI |
| ＜要旨＞ An on-surface chemical reaction allows us to synthesize atomically-defined nano carbon materials such as graphene nanoribbons. This paper describes recent measurements of mechanical and structural properties of graphene nanoribbons by high-resolution atomic force microscopy. Graphene nanoribbons were manipulated, in both lateral and vertical directions, by the tip of an atomic force microscope at low temperature. Via careful investigation of the measured forces, we found that the structural superlubricity plays a role in such measurements, otherwise high friction prevents the manipulation of large graphene nanoribbons. Keywords: Atomic Force Microscopy / Graphene Nanoribbon / On-Surface Reaction / Mechanical Property / Chemical Structure |
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| 電流計測原子間力顕微鏡による高分子薄膜太陽電池材料の電子物性評価 Electrical Property of Donor/Acceptor Polymer Blend Films Studied by Conductive Atomic Force Microscopy |
辨天 宏明 Hiroaki BENTEN |
| ＜要旨＞ Blend films consisting of a polymer donor and a polymer acceptor have gained increasing attention as a promising material candidate for polymer solar cells. The photovoltaic performance of the blend film critically depends on the charge (hole and electron) transport within the film, which is influenced by the crystallization, aggregation, and phase separation of the constituent polymers. Therefore, high-resolution techniques for characterizing the electrical properties of the blend films are of prime importance for further material and device improvement. Conductive atomic force microscopy (C-AFM) is a useful method for directly observing the charge-transport characteristics of donor/acceptor polymer blend films with a high resolution on the order of nanometers. Electrical characterizations by C-AFM visualizes the morphological features of the blend film that govern the charge transport, which is difficult to elucidate by macroscopic current-voltage measurements. Keywords: Conductive Atomic Force Microscopy / Polymer Solar Cell / Charge Transport / Conjugated Polymer / Polymer Blend / Phase Separation |
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| ナノスケール空間における振動分光 Vibrational Spectroscopy and Imaging in the Nanoscale |
早澤 紀彦 Norihiko HAYAZAWA |
| ＜要旨＞ In order to see the vibrational properies of materials in the nanoscale, tip-enhanced Raman spectroscopy (TERS) and its imaging are introduced. Seeing the nanocale beyond the diffraction limit of light has been one of the dreams in the optics field, which is now realized by the use of near-field optics based on the plasmonic properties of nano-sized noble metals. When a nano-sized matallic structure such as a metallic probe of a scanning probe microscope is irradiated by a light field, localized surface plasmon polaritons can be induced resulting in the enhanced electric field localized at the tip apex. Scanning the enhanced electric field as a nanoscale light source for Raman spectroscopy can visualize the vibrational properities under the tip apex, in which the size is comparable to the diameter of the tip (～20 nm). In recent works, TERS proved its potential for sub-nanometer spatial resolution and single molecule sensitivity in various environments, liquid, ultrahigh vacuum and low temperature as well as under ambient temperatures. Keywords: Near-Field Optics / Raman / Nanophotonics / Plasmonics |
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| AFMによる多細胞系の力学測定 AFM Mechanical Measurement of Cells in Multicellular System |
藤井 裕紀・岡嶋 孝治 Yuki FUJII, Takaharu OKAJIMA |
| ＜要旨＞ Mechanical properties of living cells as soft materials are strongly associated with their biological functions. Atomic force microscopy (AFM) has been widely used to quantify the elastic modulus of single cells at the subcellular resolution. Using a developed AFM technique for characterizing the spatial distribution of the elastic modulus of cells in multi-cellular systems, we observed a mechanical domain structure in the epithelial cell monolayer (cell sheet) where the spatial correlation length of the intracellular elastic modulus was longer than the distance between adjacent cells. Moreover, it was found that the mechanical domains disappeared when actin filament and junctional proteins polymerizations were inhibited. These results indicate that the mechanical domain structures observed by AFM inherently arises from the formation of a large-scale actin filament structure via E-cadherin-dependent cell-cell junctions. Keywords: Atomic Force Microscopy (AFM) / Cell Mechanics / Multicellular System / Spatial Distribution / Elastic Modulus / Cell Monolayer / Actin Filament / Junctional Protein |
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| 走査型イオンコンダクタンス顕微鏡による多項目ナノイメージング Electrochemical Nano-Imaging using Scanning Ion Conductance Microscopy |
梨本 裕司・平 典子・ 伊野 浩介・珠玖 仁 Yuji NASHIMOTO, Noriko TAIRA, Kosuke INO, Hitoshi SHIKU |
| ＜要旨＞ Scanning ion conductance microscopy (SICM) is a nanopipette-based microscopy that visualizes topography of a sample under physiological conditions. The main advantage of SICM is that it can detect topological imaging noninvasively and control a distance between nanopipette and sample at nanoscale. This article highlights the recent applications of SICM to acquire multifunctional information from biological samples at nanoscale. The first is surface charge mapping. The design and use of specific voltage routines could extract the information of surface charge with the topological information. The second is the conductance measurement across tight junctions. Using double barrel format, while one barrel provides the traditional SICM feedback, another barrel measures the conductivities simultaneously. The third is the evaluation of mRNA localization of single cells. The subcellular cytosol was collected and the gene expression analyzed based on the nanoscale topological mapping by SICM. Integration of SICM with these measurement techniques will open up new avenues in biological study at nanoscale. Keywords: Scanning Ion Conductance Microscopy / Nanopipette / Electrochemical Imaging / Charge Mapping / Single-Cell Analysis / Cellular Imaging / mRNA Localization / Tight Junction |
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| プローブ顕微鏡を活用したナノファイバーの導電性評価 Electrical Conductivity Evaluation of Conducting Polymer Nanofibers by Scanning Probe Microscopy |
下村 武史 Takeshi SHIMOMURA |
| ＜要旨＞ I introduce the usage of scanning probe microscopy (SPM) for the electrical measurement of conducting polymer nanofibers. SPM seems to have three prominent operations, that is, observation, manipulation and direct measurement. At first, we used the observation mode in scanning force microscopy (SFM or AFM) for the counting of the number of the nanofibers bridging the electrodes, and decided the carrier mobility of the nanofibers from the field effect transistor characteristics. Next, we used the manipulation mode of SPM for cutting the nanofibers one by one on the electrodes and measured the conductivity of a single nanofiber. Finally, the electric potential of the nanofibers embeded in the polymethacrylate biased by the outside electrodes was investigated directly by Kelvin force microscopy (KFM) of SPM. SPM is one of the powerful tools for measuring the electric properties of the polymeric materials in the nanoworld. Keywords: Scanning Probe Microscope / Manipulation / Kelvin Prove Microscopy / Conducting Polymer / Nanofiber / Field Effect Transistor |
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| グローイングポリマー Polymer Science and I: A Personal Account |
| 多様なネットワークに助けられて With Diverse Networks |
アルブレヒト 建 Ken ALBRECHT |
| ＜要旨＞ This essay briefly describes my research career and relation to science that started when I was born in Mainz (Germany). The importance of having connections to diverse networks including scientists from other fields will be also emphasized based on my personal experience. |
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| 高分子科学最近の進歩 Front-Line Polymer Science |
| 有機EL素子の高効率化 ～有機材料の中で最も速い逆項間交差の実現、さらに高分子系への展開に向けて～ Toward Higher Efficiency in Organic Light-Emitting Diodes: Realization of the Highest Reverse Intersystem Crossing Among All Organic Materials |
梶 弘典 Hironori KAJI |
| ＜要旨＞ The pioneering work by Dr. Tang has motivated many industrial and academic researchers all over the world to develop highly efficient organic light-emitting diodes (OLEDs). Among the researches, a new type of emitters, named thermally activated delayed fluorescence (TADF), was discovered by Prof. Adachi, which opens a new horizon of OLEDs. Now, many groups including our group have developed new TADF materials resulting in OLEDs with high external quantum efficiencies. However, reverse intersystem crossing (RISC), the key process of TADF, is still inefficient when both S1 and T1 have the same charge transfer (CT) character. On this issue, recent studies predict that intervention of locally excited triplet (3LE) states between the two CT-type S1 (1CT) and T1 (3CT) is expected to trigger fast spin-flip. Here, we will show a new material design concept to further accelerate RISC. The design realizes excellent energy matching of the three states, 1CT, 3CT, and 3LE, with sufficient spin-orbit coupling. Keywords: Organic Light-Emitting Diodes / Reverse Intersystem Crossing / Thermally Activated Delayed Fluorescence / Donor-Acceptor Systems / Materials Science |
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