| 高分子 Vol.66 No.8 |
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特集 大型施設を活用した高分子分析の最前線
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| 展望 COVER STORY: Highlight Reviews |
| 中性子散乱による高分子研究 Polymer Research with Neutron Scattering |
柴山充弘 Mitsuhiro SHIBAYAMA |
| ＜要旨＞ 日本における中性子散乱を用いた物質研究の本格的利用開始から約四半世紀、大型中性子源J-PARCの運転開始から約10年が経過した。中性子散乱による高分子研究の現状と問題点、将来展望について述べる。 Keywords: Neutron Scattering / JRR-3 / J-PARC MLF / General-User-Program / SANS-U / TAIKAN / SOFIA |
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| 大強度陽子加速器の中性子小角散乱の最新 Advanced Small-Angle Neutron Scattering at High Intenisty Proton Accelarater |
小泉 智・能田洋平 Satoshi KOIZUMI, Yohei NODA |
| ＜要旨＞ 大強度陽子加速器（J-PARC）の中性子小角散乱は、パルス中性子と飛行時間法を組み合わせることで、原子サイズのミクロからメゾスコピックのマルチスケールを瞬時に観察できる。さらに同施設で展開する「動的核スピン偏極コントラスト変調」を「製品そのもの」の分析技術として紹介する。 Keywords: Small-Angle Neutron Scattering / Pulse Neutron / Time-of-Flight / Dynamic Nuclear Spin Polarization / Contrast Variation |
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| 放射光SAXSの特性を活用した高分子分析 Polymer Characterizations by Unique Methods of Synchrotron SAXS |
秋葉 勇 Isamu AKIBA |
| ＜要旨＞ 高分子の構造研究における放射光X線を光源とした小角X線散乱（SAXS）は、産学問わず非常に多くの研究に用いられるようになっており、その重要性はますます高まっている。本稿では、放射光SAXSを利用した高分子の分析手法について概観したのち、比較的新しい分析手法であるX線光子相関分光法とX線小角異常散乱について紹介する。 Keywords: Synchrotron Radiation / Small-Angle X-Ray Scattering / X-Ray Photon Correlation Spectroscopy / Anomalous Small-Angle X-Ray Scattering / Tender X-Ray / Soft-X-Ray |
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| トピックス COVER STORY: Topics and Products |
| 放射光X線散乱による高分子液晶の長周期構造解析 Long Period Structures in Polymer Liquid Crystals Investigated using Synchrotron Radiation X-Ray Scattering |
戸木田雅利 Masatoshi TOKITA |
| ＜要旨＞Long period structures in smectic LCs of PB-n polyesters were investigated using synchrotron radiation X-ray scattering. The PB-10 polyesters formed smectic I (SmI) LCs that consisted of 40-nm-thick lamellae stacked along the polymer chain direction. Although the LC lamella thickness (d LC) was largely independent of the degree of polymerization (DP), the isotropization temperature (T i) of the SmI LCs decreased by 12℃ with decreasing the DP. It is explainable if polymer chain ends are included in the lamellae. In the equimolar copolyester of PB-8 and PB-12, d LC was as large as 100 nm, comparable to the chain contour length, indicating the formation of extended chain lamellae. In the copolymer smectic LC, the smectic layer order decreased due to the dissimilarity of the comonomer lengths while the hexagonal order in the lateral packing of the chains was sustained. Keywords: Smectic Liquid Crystal / Main-Chain Liquid Crystal Polymer / Lamella / Long Period / Synchrotoron Radiation / Small Angle X-Ray Scattering |
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| 企業研究開発における困ったときのSPring-8 Utilization of SPring-8 BL03XU for Corporate R&D |
浅田光則 Mitsunori ASADA |
| ＜要旨＞Corporate R&D rooted in a principle of polymer structure formation is increasingly important, and the level of demands for structural analysis technologies and problem solving ability becomes higher. We have been actively considering the application of the advanced X-ray scattering/diffraction methods at the large synchrotron radiation facility SPring-8 already for some times to differentiate and improve our corporate R&D abilities. In particular, we have designed equipment and systems for performing in-situ observations with high precision, in order to reproduce a state that is nearly identical to actual polymer production and processing process. So far, we have evaluated varieties of polymer processing such as stretching of polyvinyl alcohol films in water, drawing of polyvinyl alcohol fibers, cast film formation of polyvinyl alcohol aqueous solutions, thermoforming of highly heat resistant polyamides and thermosetting of acrylic block copolymer/epoxy blends. Keywords: SAXS/WAXD / In Situ Observation / Morphology / FSBL |
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| GIWAXDによる有機半導体薄膜の構造解析 Structural Analysis of Organic Semiconductor Thin Films by GIWAXD |
小池淳一郎 Jun-ichiro KOIKE |
| ＜要旨＞ DIC is interested in the novel technology of printed electronics (PE) based on the wet process. As the new materials of next-generation electronic devices, organic semiconductor (OSC) film is attracting attention in terms of flexibility and so on. The structural understanding of OSC thin film in an actual environment is more important to the development of high-performance TFT using PE technology. Currently, we belong to the FSBL (Advanced Softmaterials Beamline) Consortium, and are able to utilize the synchrotron radiation (SR) X-ray at BL03XU of SPring-8. Here, we show the structural analysis for OSC thin films of benzothiophene type compounds, and show some practical examples of GIWAXD measurements by taking advantage of the SR X-ray characteristics. As the result of time dependent GIWAXD measurement in a drying process, it was found that molecular arrangement of out-of-plane direction fixed later than that of in-plane. In addition, the measurement of OSC thin films on the narrow electrode spacing of TFT was achieved by using a narrow SR X-ray beam. Keywords: Organic Semiconductor / Thin Film / Crystalline Structure / X-Ray Diffraction / Synchrotron Radiation X-Ray / SPring-8 / GIWAXD |
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| グローイングポリマー Polymer Science and I: A Personal Account |
| 前進と横道 Going Forward and Turning |
村岡貴博 Takahiro MURAOKA |
| ＜要旨＞ In my research carrier, I experienced synthetic, supramolecular and biorelated chemistry as a process of going forward and turning in a walk. On the basis of these experiences, I am trying to open up a new road to an original research in my future. |
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| 高分子科学最近の進歩 Front-Line Polymer Science |
| ポリマーブラシの新展開 New Strategy for Polymer Brush |
横山英明 Hideaki YOKOYAMA |
| ＜要旨＞Polymer brush has been attracting interests from scientists and engineers for an effective surface modification method. The development of precise synthesis increased the available polymer spices for polymer brush. Polymer brush has been studied experimentally as well as theoretically. Polymer brush can be characterized with two physical parameters, height and density of brush. Theory predicts extended polymer chains with increasing brush density. The height becomes proportional to the number of segments in brushes. It is increasingly important to measure height and density of brush to understand its property. However, there are only a limited number of experimental tools available for measuring such parameters. Neutron reflectivity is one of few methods for such analysis. In addition to the traditional brush system, the new method to fabricate polymer brush using surface/interface segregation of amphiphilic block copolymer has emerged. In order to partition an amphiphilic diblock copolymer at air surface, the amphiphilic block copolymer must have unique surface activity. Several examples of such air surface segregating system are presented. In addition, segregation of amphiphilic block copolymers from elastomer matrix to water interface was also used to form polymer brush in water. Such system can be called “dynamic polymer brush”, in which self-repairing of brush is expected. Keywords: Polymer Brush / Block Copolymer / Segregation / Interface / Dynamic Polymer Brush / Self-Repairing |
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